Akaike information criterion statistics
Akaike information criterion statistics
Reliability Analysis of Large Software Systems: Defect Data Modeling
IEEE Transactions on Software Engineering
Orthogonal defect classification
Handbook of software reliability engineering
Software Engineering Economics
Software Engineering Economics
Software Cost Estimation with Cocomo II with Cdrom
Software Cost Estimation with Cocomo II with Cdrom
The Lognormal Distribution of Software Failure Rates: Origin and Evidence
ISSRE '98 Proceedings of the The Ninth International Symposium on Software Reliability Engineering
ISSRE '98 Proceedings of the The Ninth International Symposium on Software Reliability Engineering
An Integrated Failure Detection and Fault Correction Model
ICSM '02 Proceedings of the International Conference on Software Maintenance (ICSM'02)
Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction
ISSRE '03 Proceedings of the 14th International Symposium on Software Reliability Engineering
Analysis of Software Fault Removal Policies Using a Non-Homogeneous Continuous Time Markov Chain
Software Quality Control
From Test Count to Code Coverage using the Lognormal Failure Rate
ISSRE '04 Proceedings of the 15th International Symposium on Software Reliability Engineering
Software Defect Rediscoveries: A Discrete Lognormal Model
ISSRE '05 Proceedings of the 16th IEEE International Symposium on Software Reliability Engineering
A large-scale study of failures in high-performance computing systems
DSN '06 Proceedings of the International Conference on Dependable Systems and Networks
Queuing Models for Field Defect Resolution Process
ISSRE '06 Proceedings of the 17th International Symposium on Software Reliability Engineering
How Long Will It Take to Fix This Bug?
MSR '07 Proceedings of the Fourth International Workshop on Mining Software Repositories
A multiplicative model of software defect repair times
Empirical Software Engineering
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We analyzed over 10,000 software defect repair times collected for nine products at Cisco Systems, to confirm our hypothesis that software defect repair times can be characterized by the Laplace Transform of the Lognormal (LTLN) distribution. This hypothesis originated from the observation that software defect repair times are influenced by the multiplicative interplay of several factors. The Lognormal distribution is a natural choice to model rates of occurrence of such phenomenon. Conversion of the Lognormal rate distribution to an occurrence time distribution yields the LTLN. Our results also confirm that the LTLN distribution provides a statistically better fit to the observed repair times than either of the two most widely used repair time distributions, the lognormal and the exponential.