Akaike information criterion statistics
Akaike information criterion statistics
Reliability Analysis of Large Software Systems: Defect Data Modeling
IEEE Transactions on Software Engineering
Orthogonal defect classification
Handbook of software reliability engineering
Software Engineering Economics
Software Engineering Economics
The Lognormal Distribution of Software Failure Rates: Origin and Evidence
ISSRE '98 Proceedings of the The Ninth International Symposium on Software Reliability Engineering
ISSRE '98 Proceedings of the The Ninth International Symposium on Software Reliability Engineering
An Integrated Failure Detection and Fault Correction Model
ICSM '02 Proceedings of the International Conference on Software Maintenance (ICSM'02)
Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction
ISSRE '03 Proceedings of the 14th International Symposium on Software Reliability Engineering
Analysis of Software Fault Removal Policies Using a Non-Homogeneous Continuous Time Markov Chain
Software Quality Control
From Test Count to Code Coverage using the Lognormal Failure Rate
ISSRE '04 Proceedings of the 15th International Symposium on Software Reliability Engineering
Software Defect Rediscoveries: A Discrete Lognormal Model
ISSRE '05 Proceedings of the 16th IEEE International Symposium on Software Reliability Engineering
A large-scale study of failures in high-performance computing systems
DSN '06 Proceedings of the International Conference on Dependable Systems and Networks
Queuing Models for Field Defect Resolution Process
ISSRE '06 Proceedings of the 17th International Symposium on Software Reliability Engineering
How Long Will It Take to Fix This Bug?
MSR '07 Proceedings of the Fourth International Workshop on Mining Software Repositories
Software defect repair times: a multiplicative model
Proceedings of the 4th international workshop on Predictor models in software engineering
On modeling software defect repair time
Empirical Software Engineering
Who tested my software? Testing as an organizationally cross-cutting activity
Software Quality Control
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We hypothesize that software defect repair times can be characterized by the Laplace Transform of the Lognormal (LTLN) distribution. This hypothesis is rooted in the observation that software defect repair times are influenced by the multiplicative interplay of several factors, and the lognormal distribution is a natural choice to model rates of occurrence of such phenomenon. Conversion of the lognormal rate distribution to an occurrence time distribution yields the LTLN. We analyzed a total of more than 10,000 software defect repair times collected over nine products at Cisco Systems to confirm our LTLN hypothesis. Our results also demonstrate that the LTLN distribution provides a statistically better fit to the observed repair times than either of the two most widely used repair time distributions, namely, the lognormal and the exponential. Moreover, we show that the repair times of subsets of defects, partitioned according to the Orthogonal Defect Classification (ODC) scheme also follow the LTLN distribution. Finally, we describe how the insights that lead to the LTLN repair time model allow us to consider and evaluate alternative process improvement strategies.