Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction

  • Authors:

  • Peter G. Bishop;Robin E. Bloomfield

  • Affiliations:

  • -;-

  • Venue:
  • ISSRE '03 Proceedings of the 14th International Symposium on Software Reliability Engineering
  • Year:
  • 2003

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Abstract

Prior research has suggested that the failure rates offaults follow a log normal distribution. We propose aspecific model where distributions close to a log normalarise naturally from the program structure. The lognormal distribution presents a problem when used inreliability growth models as it is not mathematicallytractable. However we demonstrate that a worst casebound can be estimated that is less pessimistic than ourearlier worst case bound theory.