Low Cost Attacks on Tamper Resistant Devices
Proceedings of the 5th International Workshop on Security Protocols
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Modeling and minimization of PMOS NBTI effect for robust nanometer design
Proceedings of the 43rd annual Design Automation Conference
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Integrated circuits with bounded lifetimes can have many business advantages. We give some simple examples of methods to enforce tunable expiration dates for chips using nanometer reliability mechanisms.