Stochastic finite elements: a spectral approach
Stochastic finite elements: a spectral approach
Tolerance Analysis of Electronic Circuits Using MATLAB
Tolerance Analysis of Electronic Circuits Using MATLAB
Semiconductor Device Modeling with Spice
Semiconductor Device Modeling with Spice
Computer-Aided Analysis of Electronic Circuits: Algorithms and Computational Techniques
Computer-Aided Analysis of Electronic Circuits: Algorithms and Computational Techniques
The Wiener--Askey Polynomial Chaos for Stochastic Differential Equations
SIAM Journal on Scientific Computing
Integrating Multiple Parallel Simulation Engines for Mixed-Technology Parallel Simulation
SS '02 Proceedings of the 35th Annual Simulation Symposium
A circuit level fault model for resistive bridges
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Numerical Challenges in the Use of Polynomial Chaos Representations for Stochastic Processes
SIAM Journal on Scientific Computing
Stochastic Power Grid Analysis Considering Process Variations
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Multi-Element Generalized Polynomial Chaos for Arbitrary Probability Measures
SIAM Journal on Scientific Computing
Proceedings of the International Conference on Computer-Aided Design
Uncertainty quantification for integrated circuits: stochastic spectral methods
Proceedings of the International Conference on Computer-Aided Design
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A methodology for efficient tolerance analysis of electronic circuits based on nonsampling stochastic simulation of transients is formulated, implemented, and validated. We model the stochastic behavior of all quantities that are subject to tolerance spectrally with polynomial chaos. A library of stochastic models of linear and nonlinear circuit elements is created. In analogy to the deterministic implementation of the SPICE electronic circuit simulator, the overall stochastic circuit model is obtained using nodal analysis. In the proposed case studies, we analyze the influence of device tolerance on the response of a lowpass filter, the impact of temperature variability on the output of an amplifier, and the effect of changes of the load of a diode bridge on the probability density function of the output voltage. The case studies demonstrate that the novel methodology is computationally faster than the Monte Carlo method and more accurate and flexible than the root-sum-square method. This makes the stochastic circuit simulator, referred to as PolySPICE, a compelling candidate for the tolerance study of reliability-critical electronic circuits.