Adaptation in natural and artificial systems
Adaptation in natural and artificial systems
Accelerating the convergence of random search methods for discrete stochastic optimization
ACM Transactions on Modeling and Computer Simulation (TOMACS)
ATPG tools for delay faults at the functional level
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Unified Methods for VLSI Simulation and Test Generation
Unified Methods for VLSI Simulation and Test Generation
Introduction to Stochastic Search and Optimization
Introduction to Stochastic Search and Optimization
An efficient method for generating exhaustive test sets
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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The aim of this paper is to explore some features of the functional test generation problem, and on the basis of the gained experience, to propose a practical method for functional test generation. In the paper presented analysis of random search methods and adjacent stimuli generation allowed formulating a practical method for generating functional tests. This method incorporates the analyzed termination conditions of generation, exploits the advantages of random and deterministic search, as well as the feature that the sets of the selected input stimuli can be merged easily in order to obtain a better set of test patterns.