Analyzing Fault Susceptibility of ABS Microcontroller

  • Authors:
  • Dawid Trawczynski;Janusz Sosnowski;Piotr Gawkowski

  • Affiliations:
  • Institute of Computer Science, Warsaw University of Technology, Warsaw, Poland 00-665;Institute of Computer Science, Warsaw University of Technology, Warsaw, Poland 00-665;Institute of Computer Science, Warsaw University of Technology, Warsaw, Poland 00-665

  • Venue:
  • SAFECOMP '08 Proceedings of the 27th international conference on Computer Safety, Reliability, and Security
  • Year:
  • 2008

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Abstract

In real-time safety-critical systems, it is important to predict the impact of faults on their operation. For this purpose we have developed a test bed based on software implemented fault injection (SWIFI). Faults are simulated by disturbing the states of registers and memory cells. Analyzing reactive and embedded systems with SWIFI tools is a new challenge related to the simulation of an external environment for the system, designing test scenarios and result qualification. The paper presents our original approach to these problems verified for an ABS microcontroller. We show fault susceptibility of the ABS microcontroller and outline software techniques to increase fault robustness.