Fault-Robust Microcontrollers for Automotive Applications

  • Authors:
  • Riccardo Mariani;Peter Fuhrmann;Boris Vittorelli

  • Affiliations:
  • YOGITECH SpA;Philips Research Laboratories;ARM Germany GmbH

  • Venue:
  • IOLTS '06 Proceedings of the 12th IEEE International Symposium on On-Line Testing
  • Year:
  • 2006

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Abstract

Like other silicon integrated circuit (IC) domains, the smart card market is very competitive and main actors are constantly trying to design the cheapest and safest circuits to ensure their consumers' satisfaction. These specificities lead smart cards ...