A unified view of test compression methods
IEEE Transactions on Computers
IC quality and test transparency
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
CIMMACS'07 Proceedings of the 6th WSEAS international conference on Computational intelligence, man-machine systems and cybernetics
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The first built-in self-test feature in a Motorola sidered a ?wart? until a RAM test application recast it as a ? feature.?Though the BIST approach?an idea conceived as a way to reduce production costs for the MC6805 family?did not meet its majordesign objective, the experience provided impetus for the development of BIST techniques for the MC6804P2, which met mostof the objectives intended for the MC6805P2. The Motorola microprocessor family has come to incorporate a growing number oftestability features; current devices typically employ a combination of BIST and other techniques. If present trends continue,transistor counts for microprocessor-related parts should approach 10 million within 10 years. The authors argue that structureddesign techniques offer the most promising prospects for solving the design and test problems resulting from this increasein complexity.