Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization

Authors:
Yiwen Shi;Kellie DiPalma;Jennifer Dworak
Affiliations:
-;-;-
Venue:
DFT '08 Proceedings of the 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems
Year:
2008

Citing 0
Cited 2

Using implications to choose tests through suspect fault identification

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A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects

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Abstract

With the technology entering the nano dimension, manufacturing processes are less and less reliable, thus drastically impacting the yield. A possible solution to alleviate this problem in the future could consist in using fault tolerant architectures ...