An IEEE 1149.1 Compliant Test Control Architecture
Journal of Electronic Testing: Theory and Applications
A Tutorial on Built-In Self-Test, Part 2: Applications
IEEE Design & Test
Optimizing Test Hardware for At-Speed Testing of Datapaths in an Integrated Circuit
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
| Hi-index | 0.00 |