Translation of the Problem of Complete Test Set Generation to Pseudo-Boolean Programming

Authors:
Pramode Ranjan Bhattacharjee;Sanjoy Kumar Basu;Jogesh Chandra Paul
Affiliations:
-;-;-
Venue:
IEEE Transactions on Computers
Year:
1991

Citing 3
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Abstract

An attempt is made to demonstrate that the problem of complete test set generation is amenable to the problem of pseudo-Boolean programming. For this purpose, various types of faults, viz., single faults, multiple faults, and bridging faults, are considered. The key issue is to obtain logical expressions for the primary output line in terms of different faulty internal nodes to find real transforms. Using standard rules, the real transforms of a Boolean function can be obtained directly without any algebraic manipulation.