On the Complexity of Generating Optimal Test Sequences

  • Authors:
  • Sylvia C. Boyd;Hasan Ural

  • Affiliations:
  • -;-

  • Venue:
  • IEEE Transactions on Software Engineering
  • Year:
  • 1991

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Abstract

The authors investigate whether maximal overlapping of protocol test subsequences can be achieved in polynomial time. They review the concepts related to FSM (finite state machine)-based test sequence generation and then define the optimal test sequence generation (OTSG) problem. It is proved that the OTSG problem is NP-complete. Therefore an efficient solution to the problem should not be expected in the general case.