Protocol testing techniques

Authors:
Baoyu Wang;David Hutchison
Affiliations:
-;-
Venue:
Computer Communications
Year:
1987

Citing 0
Cited 2

Protocol conformance test generation using multiple UIO sequences with overlapping

SIGCOMM '90 Proceedings of the ACM symposium on Communications architectures & protocols
On the Complexity of Generating Optimal Test Sequences

IEEE Transactions on Software Engineering

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Abstract