Protocol conformance test generation using multiple UIO sequences with overlapping

  • Authors:
  • B. Yang;H. Ural

  • Affiliations:
  • Department of Computer Science, University of Ottawa, Ottawa, Ontario, Canada KlN 9B4;Department of Computer Science, University of Ottawa, Ottawa, Ontario, Canada KlN 9B4

  • Venue:
  • SIGCOMM '90 Proceedings of the ACM symposium on Communications architectures & protocols
  • Year:
  • 1990

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Abstract

This paper describes an optimization method for reducing the length of protocol conformance test sequences by overlapping test subsequences obtained using UIO sequences. It is shown that test sequences generated by this method are substantially shorter than those generated by other methods employing UIO sequences.