Reducing test sequence length using invertible sequences

  • Authors:
  • Lihua Duan;Jessica Chen

  • Affiliations:
  • School of Computer Science, University of Windsor, Windsor, Ont., Canada;School of Computer Science, University of Windsor, Windsor, Ont., Canada

  • Venue:
  • ICFEM'07 Proceedings of the formal engineering methods 9th international conference on Formal methods and software engineering
  • Year:
  • 2007

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Abstract

Conformance testing has been extensively studied in the context where the desired behavior of the implementation under test is modeled in terms of finite state machines. An essential issue in FSM-based conformance testing is to generate from a given finite state machine a test sequence that is both effective in detecting the faults in the implementation under test and efficient in terms of its length. In this paper, we consider test sequences satisfying the test criterion of the U-method as they have been proved to have high fault detectability. We present our solution to reduce the length of such a test sequence by maximizing the overlap among the test segments through the use of invertible sequences.