Automating Postsilicon Debugging and Repair

Authors:
Kai-Hui Chang;Igor L. Markov;Valeria Bertacco
Affiliations:
University of Michigan, Ann Arbor;University of Michigan, Ann Arbor;University of Michigan, Ann Arbor
Venue:
Computer
Year:
2008

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Abstract

Due to increasing semiconductor design complexity, more errors are escaping presilicon verification and being discovered only after manufacturing. As an alternative to traditional manual chip repair, the authors propose the FogClear methodology, which automates the postsilicon debugging process and thereby reduces IC development time and costs.