Hierarchical Code Correction and Reliability Management in Embedded nor Flash Memories

Authors:
Benoit Godard;Jean-Michel Daga;Lionel Torres;Gilles Sassatelli
Affiliations:
-;-;-;-
Venue:
ETS '08 Proceedings of the 2008 13th European Test Symposium
Year:
2008

Citing 0
Cited 4

Energy-aware error control coding for Flash memories

Proceedings of the 46th Annual Design Automation Conference
Exploiting half-wits: smarter storage for low-power devices

FAST'11 Proceedings of the 9th USENIX conference on File and stroage technologies
Half-Wits: Software Techniques for Low-Voltage Probabilistic Storage on Microcontrollers with NOR Flash Memory

ACM Transactions on Embedded Computing Systems (TECS) - Special Section on Probabilistic Embedded Computing
Memory Reliability Improvement Based on Maximized Error-Correcting Codes

Journal of Electronic Testing: Theory and Applications

Quantified Score

Hi-index	0.00

Visualization

Abstract

Dr. Gordon E. Moore’s Law - Integration’s Capacity Doubles Every Two Years - is under server pressure. Leakage power is the major factor in the challenge to keep Moore’s Law alive and well. As process technologies continue to shrink, ...