An Algorithm for Testing Random Access Memories
IEEE Transactions on Computers
Implementation of an Experimental Fault-Tolerant Memory System
IEEE Transactions on Computers
An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories
IEEE Transactions on Computers
Real-time fault detection for small computers
AFIPS '72 (Spring) Proceedings of the May 16-18, 1972, spring joint computer conference
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The subject of automatic fault location in memory systems by program so far has been neglected in computer literature. A program (AMNESA) has been written at Honeywell that not only detects failures in memory, but also diagnoses the cause of the failure. This paper describes the approach used in the writing of AMNESA. It is also shown that this approach can be used for different memory organizations.