Randomness quality of permuted pseudorandom binary sequences

  • Authors:
  • Syn Kiat Tan;Sheng-Uei Guan

  • Affiliations:
  • Department of Electrical and Computer Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260, Singapore;Department of Computer Science & Software Engineering, Xian Jiatong-Liverpool University, Suzhou, China

  • Venue:
  • Mathematics and Computers in Simulation
  • Year:
  • 2009

Quantified Score

Hi-index 0.00

Visualization

Abstract

This paper uses the DIEHARD statistical test suite to test the randomness quality of ''permuted'' versions of maximum length sequences generated by linear finite state machines (LFSM) such as cellular automata and linear feedback shift registers. Analysis shows that permuted sequences can be equivalently generated by using time-varying transformations derived from the original LFSM. Based on the above, we suggest the permuted transformation sequence scheme. Experimental results show that DIEHARD results are improved with respect to the original non-permuted sequences-up to seven more tests can be passed (total of 19 tests). Furthermore, a permutation vector is used to generate cyclically distinct permuted sequences and each sequence has a desirable maximum length period of 2^n-1.