SC-net: a hybrid connectionist, symbolic system
Information Sciences: an International Journal
Artificial Intelligence Review - Special issue on lazy learning
Semiconductor fabrication facility design using a hybrid search methodology
Computers and Industrial Engineering
An extended database design methodology for uncertain data management
Information Sciences—Informatics and Computer Science: An International Journal
Data mining for customer service support
Information and Management
Feature Selection for Knowledge Discovery and Data Mining
Feature Selection for Knowledge Discovery and Data Mining
Case base building with similarity relations
Information Sciences: an International Journal
A new hybrid case-based architecture for medical diagnosis
Information Sciences—Informatics and Computer Science: An International Journal
Data mining for yield enhancement in semiconductor manufacturing and an empirical study
Expert Systems with Applications: An International Journal
Recognition of semiconductor defect patterns using spatial filtering and spectral clustering
Expert Systems with Applications: An International Journal
An association-based case reduction technique for case-based reasoning
Information Sciences: an International Journal
Financial distress prediction based on OR-CBR in the principle of k-nearest neighbors
Expert Systems with Applications: An International Journal
Global optimization of case-based reasoning for breast cytology diagnosis
Expert Systems with Applications: An International Journal
Defect spatial pattern recognition using a hybrid SOM-SVM approach in semiconductor manufacturing
Expert Systems with Applications: An International Journal
Expert Systems with Applications: An International Journal
Single-machine scheduling with sum-of-logarithm-processing-times-based learning considerations
Information Sciences: an International Journal
Some single-machine and m-machine flowshop scheduling problems with learning considerations
Information Sciences: an International Journal
Multi-agent neural business control system
Information Sciences: an International Journal
A forecasting solution to the oil spill problem based on a hybrid intelligent system
Information Sciences: an International Journal
Expert Systems with Applications: An International Journal
Information Sciences: an International Journal
Information Sciences: an International Journal
Two machine-learning techniques for mining solutions of the ReleasePlannerTM decision support system
Information Sciences: an International Journal
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Yield management in semiconductor manufacturing companies requires accurate yield prediction and continual control. However, because many factors are complexly involved in the production of semiconductors, manufacturers or engineers have a hard time managing the yield precisely. Intelligent tools need to analyze the multiple process variables concerned and to predict the production yield effectively. This paper devises a hybrid method of incorporating machine learning techniques together to detect high and low yields in semiconductor manufacturing. The hybrid method has strong applicative advantages in manufacturing situations, where the control of a variety of process variables is interrelated. In real applications, the hybrid method provides a more accurate yield prediction than other methods that have been used. With this method, the company can achieve a higher yield rate by preventing low-yield lots in advance.