Fault covering problems in reconfigurable VLSI systems
Authors:
Ran Libeskind-Hadas;Nany Hasan;Jason Cong;Philip K. McKinley;C. L. Liu
Affiliations:
Univ. of Illinois at Urbana-Champaign, Urbana;IBM Corp.;Univ. of California, Los Angeles;Michigan State Univ., East Lansing;Univ. of Illinois at Urbana-Champaign, Urbana
Venue:
Fault covering problems in reconfigurable VLSI systems