Analysis of dual-Vt SRAM cells with full-swing single-ended bit line sensing for on-chip cache
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Segmented virtual ground architecture for low-power embedded SRAM
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Efficient built-in redundancy analysis for embedded memories with 2-d redundancy
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Low power feature associated with Static Random Access Memory (SRAM) is evaluated. By using gating transistor power saving technique (GTSPT), the average power of SRAM can be reduced. Using GTSPT scheme the average precharge current and the supply current is reduced which is the main cause of the power dissipation in the SRAM. While reading the data, the bitlines are always precharged. By reducing the precharge voltage, the power cane be saved. By using the sense amplifier, the data can be amplified for read operation. By adding the redundant rows and redundant columns the SRAM is made fault tolerant.