Resistive non-volatile memory devices (Invited Paper)

  • Authors:
  • Rainer Waser

  • Affiliations:
  • Jülich-Aachen Research Alliance, Section Fundamentals of Future Information Technology (JARA-FIT), RWTH Aachen University and Forschungszentrum Jülich, Germany

  • Venue:
  • Microelectronic Engineering
  • Year:
  • 2009

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Abstract

The review provides a survey of non-volatile, highly scalable memory devices which are based on redox phenomena controlling the resistance of nanoscale memory cells. The classification of the memory effects, the understanding of the underlying mechanisms, and a sketch of the integration efforts will be presented.