Face Recognition with LWIR Imagery Using Local Binary Patterns

Authors:
Heydi Méndez;Cesar San Martín;Josef Kittler;Yenisel Plasencia;Edel García-Reyes
Affiliations:
Advanced Technologies Application Center, La Habana, Cuba C.P. 12200;Dep. of Electrical Eng., University of La Frontera, Temuco, Chile;University of Surrey, Guildford, Surrey, UK GU2 7XH;Advanced Technologies Application Center, La Habana, Cuba C.P. 12200;Advanced Technologies Application Center, La Habana, Cuba C.P. 12200
Venue:
ICB '09 Proceedings of the Third International Conference on Advances in Biometrics
Year:
2009

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Abstract

In this paper, the merits of the Local Binary Patterns (LBP) representation are investigated in the context of face recognition using long-wave infrared images. Long-wave infrared images are invariant to illumination, but at the same time they are affected by a fixed-pattern noise inherent to this technology. The fixed-pattern is normally compensated by means of a non-uniformity correction method. Our study shows that the LBP approach is robust to the fixed-pattern noise, as well as to the presence of glasses. Not only no noise suppressing preprocessing is needed, but in fact if a non-uniformity correction method is applied, the image texture is amplified and the performance of the LBP degraded.