Coverage-driven automatic test generation for uml activity diagrams
Proceedings of the 18th ACM Great Lakes symposium on VLSI
Seamless testing for models and code
FASE'11/ETAPS'11 Proceedings of the 14th international conference on Fundamental approaches to software engineering: part of the joint European conferences on theory and practice of software
Transition sequence exploration of UML activity diagram using evolutionary algorithm
Proceedings of the 5th India Software Engineering Conference
Efficient self-learning techniques for SAT-based test generation
Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
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Test case generation based on design specifications is an important part of testing processes. In this paper, Unified Modeling Language activity diagrams are used as design specifications. By setting up several test adequacy criteria with respect to activity diagrams, an automatic approach is presented to generate test cases for Java programs. Instead of directly deriving test cases from activity diagrams, this approach selects test cases from a set of randomly generated ones according to a given test adequacy criterion. In the approach, we first instrument a Java program under testing according to its activity diagram model, and randomly generate abundant test cases for the program. Then, by running the instrumented program we obtain the corresponding program execution traces. Finally, by matching these traces with the behavior of the activity diagram, a reduced set of test cases are selected according to the given test adequacy criterion. This approach can also be used to check the consistency between the program execution traces and the behavior of activity diagrams.