"Split ADC" calibration for all-digital correction of time-interleaved ADC errors

Authors:
John A. McNeil;Christopher David;Michael CoIn;Rosa Croughwell
Affiliations:
Department of Electrical and Computer Engineering, Worcester Polytechnic Institute, Worcester, MA;Department of Electrical and Computer Engineering, Worcester Polytechnic Institute, Worcester, MA;Analog Devices, Inc., Wilmington, MA;Analog Devices, Inc., Wilmington, MA
Venue:
IEEE Transactions on Circuits and Systems II: Express Briefs
Year:
2009

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Abstract

The "split analog-to-digital converter (ADC)" architecture enables fully digital calibration and correction of offset, gain, and aperture-delay mismatch errors in time-interleaved ADCs. The calibration of M interleaved ADCs requires 2M +1 half-sized ADCs, a minimal increase in analog complexity. Each conversion is performed by a pair of half-sized ADCs, generating two independent outputs that are digitally corrected using estimates of offset, gain, and aperture-delay errors. The ADC outputs are averaged to produce the ADC output code. The difference of the outputs is used in a calibration algorithm that estimates the error in the correction parameters. Any nonzero difference drives a least-mean-square feedback loop toward zero difference, which can only occur when the average error in each correction parameter is zero. A simulation of a 4: 1-time-interleaved 16-bit 12-MSps successive-approximation-register ADC shows calibration convergence within 400 000 samples.