Graphics language / one - IBM Corporate-Wide physical design data format
DAC '81 Proceedings of the 18th Design Automation Conference
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
Unified Shapes Checker - a checking tool for LSI
DAC '79 Proceedings of the 16th Design Automation Conference
The recording, checking, and printing of logic diagrams
AIEE-ACM-IRE '58 (Eastern) Papers and discussions presented at the December 3-5, 1958, eastern joint computer conference: Modern computers: objectives, designs, applications
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The level of complexity and the turn-around time associated with the development of custom bipolar VLSI chips have defined the need for a highly structured physical and electrical design validation approach which can guarantee fully functional first-pass chips, yet be flexible enough to allow logical and physical designers the latitude necessary to achieve specified cost and performance objectives. This paper describes such a design verification strategy and its implied constraints on chip design. The rationale for comparing the logic equivalence of the high-level logical models to the low-level-device physical models is presented, a description of the hierarchical logical-to-physical and electrical checking is given, and its impact on cost and complexity is examined.