Versatile mask generation techniques for custom microelectronic devices
DAC '78 Proceedings of the 15th Design Automation Conference
Design rule verification based on one dimensional scans
DAC '78 Proceedings of the 15th Design Automation Conference
Fast algorithms for LSI artwork analysis
DAC '77 Proceedings of the 14th Design Automation Conference
A layout checking system for large scale integrated circuits
DAC '77 Proceedings of the 14th Design Automation Conference
IBM FSD VLSI chip design methodology
DAC '83 Proceedings of the 20th Design Automation Conference
MACH : a high-hitting pattern checker for VLSI mask data
DAC '83 Proceedings of the 20th Design Automation Conference
The scan line approach to design rules checking: Computational experiences
DAC '84 Proceedings of the 21st Design Automation Conference
A concurrent pattern operation algorithm for VLSI mask data
DAC '81 Proceedings of the 18th Design Automation Conference
Efficient Boolean operations on IC masks
DAC '81 Proceedings of the 18th Design Automation Conference
Circuit recognition and verification based on layout information
DAC '81 Proceedings of the 18th Design Automation Conference
PANAMAP-B: A mask verification system for bipolar IC
DAC '81 Proceedings of the 18th Design Automation Conference
Graphics language / one - IBM Corporate-Wide physical design data format
DAC '81 Proceedings of the 18th Design Automation Conference
Design integrity and immunity checking: A new look at layout verification and design rule checking
DAC '80 Proceedings of the 17th Design Automation Conference
An integrated mask artwork analysis system
DAC '80 Proceedings of the 17th Design Automation Conference
An Interactive Graphics System for custom design
DAC '80 Proceedings of the 17th Design Automation Conference
DAC '82 Proceedings of the 19th Design Automation Conference
LAMBDA: A quick, low cost layout design system for master-slice LSI s
DAC '82 Proceedings of the 19th Design Automation Conference
LSI layout checking using bipolar device recognition technique
DAC '79 Proceedings of the 16th Design Automation Conference
Custom chip/card design system
IBM Journal of Research and Development
Circuit recognition and verification from bipolar and MOS layout information
ACM SIGDA Newsletter
Design automation and the programmable logic array macro
IBM Journal of Research and Development
IBM Journal of Research and Development
Physical design of a custom 16-bit microprocessor
IBM Journal of Research and Development
A bipolar VLSI custom macro physical design verification strategy
IBM Journal of Research and Development
| Hi-index | 0.00 |
The designing and manufacturing techniques for integrated circuits have spawned a new free-form checking tool in IBM. This software tool has met the requirements of low cost for large volumes of data, breadth of function to support numerous methodologies, and depth of function for any specific technology.