Design automation in IBM

Authors:
P. W. Case;M. Correia;W. Gianopulos;W. R. Heller;H. Ofek;T. C. Raymond;R. L. Simek;C. B. Stieglitz
Affiliations:
IBM System Communications Division Laboratory, Kingston, New York;IBM General Technology Division Laboratory, Hopewell Junction, New York;IBM Data Processing Product Group, White Plains, New York;IBM Data Systems Division Laboratory;IBM General Technology Division Laboratory, Poughkeepsie, New York;IBM General Technology Division Laboratory, Poughkeepsie, New York;IBM Data Systems Division Laboratory;IBM System Products Division Laboratory, Endicott, New York
Venue:
IBM Journal of Research and Development
Year:
1981

Citing 16
Cited 0

Computer Logic, Testing and Verification

Computer Logic, Testing and Verification
The interconnection problem - a tutorial

DAC '73 Proceedings of the 10th Design Automation Workshop
Interactive wiring system

DAC '80 Proceedings of the 17th Design Automation Conference
An Interactive Graphics System for custom design

DAC '80 Proceedings of the 17th Design Automation Conference
Development and application of a designer oriented cyclic simulator

DAC '76 Proceedings of the 13th Design Automation Conference
A view of a user-oriented production test data generation system

DAC '70 Proceedings of the 7th Design Automation Workshop
Cellular wiring and the cellular modeling technique

DAC '69 Proceedings of the 6th annual Design Automation Conference
Prediction of wiring space requirements for LSI

DAC '77 Proceedings of the 14th Design Automation Conference
The chip layout problem: A placement procedure for lsi

DAC '77 Proceedings of the 14th Design Automation Conference
The chip layout problem: An automatic wiring procedure

DAC '77 Proceedings of the 14th Design Automation Conference
A logic design structure for LSI testability

DAC '77 Proceedings of the 14th Design Automation Conference
Automatic checking of logic design structures For compliance with testability ground rules

DAC '77 Proceedings of the 14th Design Automation Conference
Test generation for large logic networks

DAC '77 Proceedings of the 14th Design Automation Conference
Unified Shapes Checker - a checking tool for LSI

DAC '79 Proceedings of the 16th Design Automation Conference
The recording, checking, and printing of logic diagrams

AIEE-ACM-IRE '58 (Eastern) Papers and discussions presented at the December 3-5, 1958, eastern joint computer conference: Modern computers: objectives, designs, applications
Using a graphic data-processing system to design artwork for manufacturing hybrid integrated circuits

AFIPS '66 (Fall) Proceedings of the November 7-10, 1966, fall joint computer conference

Quantified Score

Hi-index	0.00

Visualization

Abstract

Within the context of the changing design requirements of digital systems spanning the semiconductor era, this paper describes the significant steps in the development of Design Automation technology in IBM. We cover the design tools which support the design of the electronic portion of such systems. The paper emphasizes the systems approaches taken and the topics of design verification, test generation, and physical design. Descriptions of the technical contributions and interactions which have led to the unique characteristics of IBM's Design Automation systems are included.