The art of computer programming, volume 3: (2nd ed.) sorting and searching
The art of computer programming, volume 3: (2nd ed.) sorting and searching
A color graphics system for I.C. mask design and analysis
DAC '78 Proceedings of the 15th Design Automation Conference
Design rule verification based on one dimensional scans
DAC '78 Proceedings of the 15th Design Automation Conference
Design integrity and immunity checking: A new look at layout verification and design rule checking
DAC '80 Proceedings of the 17th Design Automation Conference
An integrated mask artwork analysis system
DAC '80 Proceedings of the 17th Design Automation Conference
A hierarchical bit-map format for the representation of IC mask data
DAC '80 Proceedings of the 17th Design Automation Conference
Design rule checking and analysis of IC mask designs
DAC '76 Proceedings of the 13th Design Automation Conference
The automatic recognition of silicon gate transistor geometries: An LSI design aid program
DAC '76 Proceedings of the 13th Design Automation Conference
An artwork design verification system
DAC '75 Proceedings of the 12th Design Automation Conference
Fast algorithms for LSI artwork analysis
DAC '77 Proceedings of the 14th Design Automation Conference
A layout checking system for large scale integrated circuits
DAC '77 Proceedings of the 14th Design Automation Conference
CRITIC - an integrated circuit design rule checking program
DAC '74 Proceedings of the 11th Design Automation Workshop
MAP: A user-controlled automated Mask Analysis Program
DAC '74 Proceedings of the 11th Design Automation Workshop
Unified Shapes Checker - a checking tool for LSI
DAC '79 Proceedings of the 16th Design Automation Conference
Topological analysis for VLSI circuits
DAC '79 Proceedings of the 16th Design Automation Conference
A time and space efficient net extractor
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
Space efficient algorithms for VLSI artwork analysis
DAC '83 Proceedings of the 20th Design Automation Conference
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Circuit extraction and design rule checking programs make extensive use of Boolean operations which accept IC mask data as operands. A wide variety of computer algorithms have been written that implement Boolean operations on sets of geometric entities. These algorithms vary in their efficiency and can be characterized by how they represent, sort, and compare IC artwork files. A bit-map representation of IC layout data precisely localizes mask information and eliminates the need for sorting the layout data prior to or during the performance of Boolean operations. The bit patterns of the mask operands may be compared using the CPU's own Boolean operators. A compacted bit-map format that can represent IC layouts concisely, therefore, provides an excellent data base for a very efficient algorithm to perform geometric Boolean operations.