The complexity of theorem-proving procedures
STOC '71 Proceedings of the third annual ACM symposium on Theory of computing
CRITIC - an integrated circuit design rule checking program
DAC '74 Proceedings of the 11th Design Automation Workshop
KAHLUA: a hierarchical circuit disassembler
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
FLOSS: an approach to automated layout for high-volume designs
25 years of DAC Papers on Twenty-five years of electronic design automation
Fast algorithm for LSI artwork analysis
25 years of DAC Papers on Twenty-five years of electronic design automation
A layout checking system for large scale integrated circuits
25 years of DAC Papers on Twenty-five years of electronic design automation
A subjective review of compaction (tutorial session)
DAC '85 Proceedings of the 22nd ACM/IEEE Design Automation Conference
A time and space efficient net extractor
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
A layout verification system for analog bipolar integrated circuits
DAC '83 Proceedings of the 20th Design Automation Conference
A concurrent pattern operation algorithm for VLSI mask data
DAC '81 Proceedings of the 18th Design Automation Conference
Efficient Boolean operations on IC masks
DAC '81 Proceedings of the 18th Design Automation Conference
The evolution of design automation to meet the challanges of VLSI
DAC '80 Proceedings of the 17th Design Automation Conference
A hierarchical approach for layout versus circuit consistency check
DAC '80 Proceedings of the 17th Design Automation Conference
An integrated mask artwork analysis system
DAC '80 Proceedings of the 17th Design Automation Conference
A hierarchical bit-map format for the representation of IC mask data
DAC '80 Proceedings of the 17th Design Automation Conference
SLEUTH - a metal-to-metal audit program in an interactive environment
DAC '76 Proceedings of the 13th Design Automation Conference
Correction and wiring check-system for master-slice LSI
DAC '76 Proceedings of the 13th Design Automation Conference
Floss: An approach to automated layout for high-volume designs
DAC '77 Proceedings of the 14th Design Automation Conference
Fast algorithms for LSI artwork analysis
DAC '77 Proceedings of the 14th Design Automation Conference
A layout checking system for large scale integrated circuits
DAC '77 Proceedings of the 14th Design Automation Conference
LSI layout checking using bipolar device recognition technique
DAC '79 Proceedings of the 16th Design Automation Conference
Site selection and placement techniques
ACM SIGDA Newsletter
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Manual and semi-automatic methods of Integrated circuit layout are prone to errors which are often detected only after a sample chip has been fabricated. This paper describes two design verification programs that detect and identify such errors earlier in the design cycle through comparing a designer's logic description with the finished mask artwork. These programs are part of an integrated CAD system developed at RCA laboratories.