Mos LSI computer aided design system
DAC '69 Proceedings of the 6th annual Design Automation Conference
MAP: A user-controlled automated Mask Analysis Program
DAC '74 Proceedings of the 11th Design Automation Workshop
Fast algorithm for LSI artwork analysis
25 years of DAC Papers on Twenty-five years of electronic design automation
An O (N log N) algorithm for boolean mask operations
25 years of DAC Papers on Twenty-five years of electronic design automation
Space efficient algorithms for VLSI artwork analysis
DAC '83 Proceedings of the 20th Design Automation Conference
An O (N log N) algorithm for Boolean mask operations
DAC '81 Proceedings of the 18th Design Automation Conference
Efficient Boolean operations on IC masks
DAC '81 Proceedings of the 18th Design Automation Conference
Fast algorithms for LSI artwork analysis
DAC '77 Proceedings of the 14th Design Automation Conference
LSI layout checking using bipolar device recognition technique
DAC '79 Proceedings of the 16th Design Automation Conference
The design of an efficient data base to support an interactive LSI layout system
DAC '79 Proceedings of the 16th Design Automation Conference
ACM SIGDA Newsletter
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This paper describes a computer program (SIGAP) that analyzes digitized LSI mask data for valid and invalid Silicon Gate transistor geometries. The program's function, as well as the topological mapping technique used, are described. The SIGAP techniques can be adopted to a variety of artwork data preparation tasks, such as elimination of redundancy, overlap creation, area shrink/expand, the decomposition of polygons to equivalent rectangles or vice versa and performing Boolean operations between regions on different masks. The program was implemented in assembly language on a mini-computer using structured programming methods. It efficiently handles data files which are much larger than available core memory.