Space efficient algorithms for VLSI artwork analysis

  • Authors:
  • Thomas G. Szymanski;Christopher J. Van Wyk

  • Affiliations:
  • Bell Laboratories, Murray Hill, New Jersey;Bell Laboratories, Murray Hill, New Jersey

  • Venue:
  • DAC '83 Proceedings of the 20th Design Automation Conference
  • Year:
  • 1983

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Abstract

We present algorithms for performing connectivity analysis, transistor identification, and boolean geometric operations with region numbering. Previous methods all require O(n) space where n is the number of edges in the circuit artwork; our method takes only O(@@@@n) space and can therefore handle circuits of any foreseeable size. Our algorithms are based on traditional scanline techniques in such a way that any implementation of our method will be at least as fast, as well as more compact. Statistics on one such implementation are presented.