RF microelectronics
Scientific Computing: An Introductory Survey
Scientific Computing: An Introductory Survey
Low-Cost Alternate EVM Test for Wireless Receiver Systems
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
Use of Embedded Sensors for Built-In-Test of RF Circuits
ITC '04 Proceedings of the International Test Conference on International Test Conference
Bridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal Testing
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Alternate Diagnostic Testing and Compensation of RF Transmitter Performance Using Response Detection
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Quadrature receiver mismatch calibration
IEEE Transactions on Signal Processing
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Due to the increasing complexity of radio-frequency circuits, their testing becomes more challenging. A large number of performance parameters under several operation conditions are needed in order to ensure compliance to specifications. In this paper, we present a low-cost test methodology that determines significant performance parameters, such as path gain IIP3, quadrature imbalances, noise, bit error rate, and error vector magnitude through a single test setup. The proposed test methodology is applicable for both single-carrier and multicarrier systems. Simulation and measurement results indicate that these performance parameters can be calculated and estimated accurately through a single test setup and using a shorter test sequence than required by traditional techniques. In addition, a calibration technique is presented for single-carrier systems to recover marginally failing devices through analytically correcting performance parameters.