RF microelectronics
Low-Cost Alternate EVM Test for Wireless Receiver Systems
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
RF TESTING ON A MIXED SIGNAL TESTER
ITC '04 Proceedings of the International Test Conference on International Test Conference
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
RF System Design of Transceivers for Wireless Communications
RF System Design of Transceivers for Wireless Communications
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Low-cost characterization and calibration of RF integrated circuits through I-Q data analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices is an appreciable percentage of the overall cost, which typically results from the high number of specifications, the high number of distinct test set-ups and equipment pieces that need to be used, and the high cost of each test set-up. In this paper, we investigate the versatility of EVM measurements to test the variable-envelope WLAN (Wireless Local Area Networks) receiver and transmitter characteristics. The goal is to optimize EVM test parameters (input data and test limits) and to reduce the number of specification measurements that require high test times and/or expensive test equipment. Our analysis shows that enhanced EVM measurements(optimized data sequence and limits, use of RMS, scale, and phase error vector values) in conjunction with a set of simple path measurements (input-output impedances) can provide the desired fault coverage while eliminating lengthy spectrum mask and noise figure tests