RF TESTING ON A MIXED SIGNAL TESTER

  • Authors:
  • Dana Brown;John Ferrario;Randy Wolf;Jing Li;Jayendra Bhagat

  • Affiliations:
  • IBM Corporation Essex Junction, VT, USA;IBM Corporation Essex Junction, VT, USA;IBM Corporation Essex Junction, VT, USA;IBM Corporation Essex Junction, VT, USA;IBM Corporation Essex Junction, VT, USA

  • Venue:
  • ITC '04 Proceedings of the International Test Conference on International Test Conference
  • Year:
  • 2004

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Abstract

In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test equipment (ATE) will be used for this. A global positioning system (GPS) device is used as the example to illustrate how to develop the RF test plan with this usage. The test plan developed includes fast, costeffective and dedicated circuitry.