RF Testing on a Mixed Signal Tester

Authors:
Dana Brown;John Ferrario;Randy Wolf;Jing Li;Jayendra Bhagat;Mustapha Slamani
Affiliations:
RF Test Development Group, IBM Microelectronics, Essex Junction, USA 05452;RF Test Development Group, IBM Microelectronics, Essex Junction, USA 05452;RF Test Development Group, IBM Microelectronics, Essex Junction, USA 05452;RF Test Development Group, IBM Microelectronics, Essex Junction, USA 05452;RF Test Development Group, IBM Microelectronics, Essex Junction, USA 05452;RF Test Development Group, IBM Microelectronics, Essex Junction, USA 05452
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2007

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Abstract

In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test equipment (ATE) will be used. In this paper, a more universal test structure utilizing RF building blocks is proposed. A global positioning system (GPS) device is used as an example to illustrate how to develop the RF test plan with this usage. The test plan developed includes fast, cost-effective and dedicated circuitry.