Quadratic backward propagation of variance for nonlinear statistical circuit modeling

Authors:
Ivica Stevanovic;Colin C. McAndrew
Affiliations:
ABB Corporate Research, Baden-Dättwil, Switzerland and Electromagnetics and Acoustics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland and Freescale Semic ...;Freescale Semiconductor, Tempe, AZ
Venue:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Year:
2009

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Abstract

Accurate statistical modeling and simulation are keys to ensure that integrated circuits (ICs) meet the specifications over the stochastic variations that are inherent in IC manufacturing technologies. Backward propagation of variance (BPV) is a general technique for statistical modeling of semiconductor devices. However, the BPV approach assumes that statistical fluctuations are not large so that variations in device electrical performances can be modeled as linear functions of process parameters. With technology scaling, device performance variability over manufacturing variations becomes nonlinear. In this paper, we extend the BPV technique to take into account these nonlinearities. We present the theory behind the technique and apply it to specific examples. We also investigate the effectiveness of several possible solution algorithms.