MOSFET modeling for 45nm and beyond
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Quadratic backward propagation of variance for nonlinear statistical circuit modeling
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Advanced Monte Carlo techniques in the simulation of CMOS devices and circuits
NMA'10 Proceedings of the 7th international conference on Numerical methods and applications
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Statistical SPICE modeling is necessary for low risk IC design. Here existing approaches to statistical modeling are reviewed, and their limitations are discussed. A four level hierarchy of IC manufacturing variations is presented. Using physically based process and geometry level modeling, sensitivity analysis, and propagation of variance, it is shown how statistical models can be accurately and efficiently derived from the statistical distributions of key device electrical performances, as measured on manufacturing lines. The procedure runs in minutes of am engineering workstation, and guarantees accurate modeling of manufacturing variations.