Evolving fault tolerant digital circuitry: comparing population-based and correlation-based methods

Authors:
Garrison Greenwood;Makarand Joshi
Affiliations:
Dept. of Elect. & Computer Engr., Portland State University, Portland, OR;Dept. of Elect. & Computer Engr., Portland State University, Portland, OR
Venue:
CEC'09 Proceedings of the Eleventh conference on Congress on Evolutionary Computation
Year:
2009

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Abstract

Embedded systems require fault-tolerant circuitry if they are going to survive in harsh environments over extended time periods. Two approaches to evolving fault-tolerant digital circuitry have been proposed. In the population-based method circuits that perform well in the presence of specific faults are extracted from an evolving population. In the correlation-based method circuits that exhibit different fault patterns are extracted and a majority voter determines the final behavior. In this paper we compare the two fault-tolerant methods using a 2 × 3 binary multiplier circuit as the test case.