Principles in the Evolutionary Design of Digital Circuits—Part I
Genetic Programming and Evolvable Machines
Neutrality and the Evolvability of Boolean Function Landscape
EuroGP '01 Proceedings of the 4th European Conference on Genetic Programming
Techniques for Estimation of Design Diversity for Combinational Logic Circuits
DSN '01 Proceedings of the 2001 International Conference on Dependable Systems and Networks (formerly: FTCS)
Towards the Automatic Design of More Efficient Digital Circuits
EH '00 Proceedings of the 2nd NASA/DoD workshop on Evolvable Hardware
Getting Most Out of Evolutionary Approaches
EH '02 Proceedings of the 2002 NASA/DoD Conference on Evolvable Hardware (EH'02)
Word Voter: A New Voter Design for Triple Modular Redundant Systems
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Evolutionary Strategies And Intrinsic Fault Tolerance
EH '01 Proceedings of the The 3rd NASA/DoD Workshop on Evolvable Hardware
A Design Diversity Metric and Reliability Analysis for Redundant Systems
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Evolved fault tolerance in evolvable hardware
CEC '02 Proceedings of the Evolutionary Computation on 2002. CEC '02. Proceedings of the 2002 Congress - Volume 02
ICES '08 Proceedings of the 8th international conference on Evolvable Systems: From Biology to Hardware
Evolving fault tolerant digital circuitry: comparing population-based and correlation-based methods
CEC'09 Proceedings of the Eleventh conference on Congress on Evolutionary Computation
Fault-tolerance simulation of brushless motor control circuits
EvoApplications'11 Proceedings of the 2011 international conference on Applications of evolutionary computation - Volume Part II
Co-evolutionary automatic programming for software development
Information Sciences: an International Journal
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In this paper, we show how artificial evolution can be used to improve the fault-tolerance of electronic circuits. We show that evolution is able to improve the fault tolerance of a digital circuit, given a known fault model. Evolution is also able to create sets of different circuits that, when combined into an ensemble of circuits, have reduced correlation in their fault pattern, and therefore improved fault tolerance. An important part of the algorithm used to create the circuits is a measure of the correlation between the fault patterns of different circuits. Using this measure in the fitness, the circuits evolve towards different, highly fault-tolerant circuits. The measure also proves very useful for fitness sharing purposes. We have evolved a number of circuits for a simple 2×3 multiplier problem, and use these to demonstrate the performance under different simulated fault models.