A Design Diversity Metric and Reliability Analysis for Redundant Systems

  • Authors:
  • Subhasish Mitra;Nirmal R. Saxena;Edward J. McCluskey

  • Affiliations:
  • -;-;-

  • Venue:
  • ITC '99 Proceedings of the 1999 IEEE International Test Conference
  • Year:
  • 1999

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Abstract

Design diversity has long been used to protect redundantsystems against common-mode failures. The conventionalnotion of diversity relies on "independent" generation of"different" implementations. This concept is qualitativeand does not provide a basis to compare the reliabilities oftwo diverse systems. In this paper, for the first time, wepresent a metric to quantify diversity among severaldesigns. Based on this metric, we derive analyticalreliability models that show a simple relationship betweendesign diversity, system failure rate, and mission time. Inaddition, we present simulation results to demonstrate theeffectiveness of design diversity in Duplex and TripleModular Redundant (TMR) systems. For independentmultiple-module failures, we show that, mere use ofdifferent implementations does not always guarantee higherreliability compared to redundant systems with identicalimplementations - it is important to analyze thereliability of redundant systems using our metric. Forcommon-mode failures and design faults, there is asignificant gain in using different implementations -however, as our analysis shows, the gain diminishes as themission time increases. Our simulation results alsodemonstrate the usefulness of diversity for enhancing theself-testing properties of redundant systems.