IBM Journal of Research and Development
Reliable computer systems (2nd ed.): design and evaluation
Reliable computer systems (2nd ed.): design and evaluation
Randomized algorithms
Digital integrated circuits: a design perspective
Digital integrated circuits: a design perspective
Fault-tolerant computer system design
Fault-tolerant computer system design
Computers and Intractability: A Guide to the Theory of NP-Completeness
Computers and Intractability: A Guide to the Theory of NP-Completeness
Stuck-Fault Tests vs. Actual Defects
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Modeling and Testing a Critical Fault-Tolerant Multi-Process System
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
Design Diversity for Concurrent Error Detection in Sequential Logic Circuts
VTS '01 Proceedings of the 19th IEEE VLSI Test Symposium
A Design Diversity Metric and Reliability Analysis for Redundant Systems
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Failure-Tolerant Sequential Machines with Past Information
IEEE Transactions on Computers
Probabilistic Treatment of General Combinational Networks
IEEE Transactions on Computers
Fault Folding for Irredundant and Redundant Combinational Circuits
IEEE Transactions on Computers
A Design Diversity Metric and Analysis of Redundant Systems
IEEE Transactions on Computers
Using negative correlation to evolve fault-tolerant circuits
ICES'03 Proceedings of the 5th international conference on Evolvable systems: from biology to hardware
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Abstract: Design diversity has long been used to protect redundant systems against common-mode failures. The conventional notion of diversity relies on "independent" generation of "different" implementations of the same logic function. This concept is qualitative and does not provide a basis to compare the reliabilities of two diverse systems. In a recent paper, we presented a metric to quantify diversity among several designs. The problem of calculating the diversity metric is NP-complete and can be of exponential complexity. In this paper, we present techniques to estimate the value of the design diversity metric. For datapath designs, we have formulated very fast techniques to calculate the value of the metric by exploiting the regularity in the datapath structures. For general combinational logic circuits, we present an adaptive Monte-Carlo simulation technique for estimating bounds on the value of the metric. The adaptive Monte-Carlo simulation technique provides accurate estimates of the design diversity metric; the number of simulations used to reach this estimate is polynomial (instead of exponential) in the number of circuit inputs. Moreover, the number of simulations can be tuned depending on the desired accuracy.