Evolved fault tolerance in evolvable hardware

  • Authors:
  • R. O. Canham;A. M. Tyrrell

  • Affiliations:
  • Dept. of Electron., York Univ., UK;Dept. of Electron., York Univ., UK

  • Venue:
  • CEC '02 Proceedings of the Evolutionary Computation on 2002. CEC '02. Proceedings of the 2002 Congress - Volume 02
  • Year:
  • 2002

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Abstract

This paper considers the ability of an evolved circuit to acquire fault tolerance by including fault conditions within the fitness measure of the evolutionary process. A simple oscillator circuit, implemented on a Xilinx FPGA, showed a 12 fold increase in fault-tolerance when compared to a control oscillator using realistic faults.