The interpretation and application of Rent's rule
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special issue on system-level interconnect prediction
Overview of Popular Benchmark Sets
IEEE Design & Test
Process Monitoring and Diagnosis: A Model-Based Approach
IEEE Expert: Intelligent Systems and Their Applications
The Knowledge Engineering Review
Automated benchmark model generators for model-based diagnostic inference
IJCAI'07 Proceedings of the 20th international joint conference on Artifical intelligence
Synthetic circuit generation using clustering and iteration
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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It is critical to use automated generators for synthetic models and data, given the sparsity of benchmark models for empirical analysis and the cost of generating models by hand. We describe an automated generator for benchmark models that is based on using a compositional modeling framework and employs graphical models for the system topology. We propose two novel topological models, and demonstrate their advantages, over existing graphical models, in better capturing the topological and functional properties of a class of real system, discrete circuits. We compare generated models to real systems (drawn from the ISCAS benchmark suite) according to two criteria: topological fidelity and diagnostics efficiency. Based on this comparison we identify parameters necessary for the auto-generated models to generate benchmark diagnosis circuit models with realistic properties.