Circuit noise evaluation by Padé approximation based model-reduction techniques
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Towards formal verification of analog designs
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Design/process learning from electrical test
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Proceedings of the conference on Design, automation and test in Europe: Proceedings
RF Circuit Design: Theory & Applications (2nd Edition)
RF Circuit Design: Theory & Applications (2nd Edition)
Review: Formal verification of analog and mixed signal designs: A survey
Microelectronics Journal
Verification of analog and mixed signal designs using online monitoring
IMS3TW '09 Proceedings of the 2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop
Semiconductor Device Modeling with Spice
Semiconductor Device Modeling with Spice
Time Domain Verification of Oscillator Circuit Properties
Electronic Notes in Theoretical Computer Science (ENTCS)
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Today's analog/RF design and verification face significant challenges due to circuit complexity, process variations and short market windows. In particular, the influence of technology parameters on circuits, and the issues related to noise modeling and verification still remain a priority for many applications. Noise could be due to unwanted interaction between the circuit elements or it could be inherited from the circuit elements. In addition, manufacturing disparity influence the characteristic behavior of the manufactured circuits. In this paper, we propose a methodology for modeling and verification of analog/RF designs in the presence of noise and process variations. Our approach is based on modeling the designs using stochastic differential equations (SDE) that will allow us to incorporate the statistical nature of noise. We also integrate the device variation due to 0.18μ m fabrication process in an SDE based simulation framework for monitoring properties of interest in order to quickly detect errors. Our approach is illustrated on nonlinear Tunnel-Diode and a Colpitts oscillator circuits.