Design/process learning from electrical test

Authors:
B. Koenemann
Affiliations:
Cadence Design Syst., Inc., San Jose, CA, USA
Venue:
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Year:
2004

Citing 2
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Abstract

Modern design-for-test (DFT) practices not only simplify test generation but also make it much easier to diagnose problems uncovered in electrical test. In fact, many diagnostics steps can be automated enough to enable batch processing of large quantities of fail data captured during production test. Hidden in these fail data is very valuable information about the product design, manufacturing process, and interactions between the two. The embedded tutorial provides an overview of some of the analysis methods that are being used and/or prototyped in the industry, as well as the underlying data sharing between the design and manufacturing areas that is required for and enabled by the analyses.