Multiplexed illumination for measuring BRDF using an ellipsoidal mirror and a projector

  • Authors:
  • Yasuhiro Mukaigawa;Kohei Sumino;Yasushi Yagi

  • Affiliations:
  • The Institute of Scientific and Industrial Research, Osaka University;The Institute of Scientific and Industrial Research, Osaka University;The Institute of Scientific and Industrial Research, Osaka University

  • Venue:
  • ACCV'07 Proceedings of the 8th Asian conference on Computer vision - Volume Part II
  • Year:
  • 2007

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Abstract

Measuring a bidirectional reflectance distribution function (BRDF) requires long time because a target object must be illuminated from all incident angles and the reflected light must be measured from all reflected angles. A high-speed method is presented to measure BRDFs using an ellipsoidal mirror and a projector. The method can change incident angles without a mechanical drive. Moreover, it is shown that the dynamic range of the measured BRDF can be significantly increased by multiplexed illumination based on the Hadamard matrix.