The Minimal Test Set for Multioutput Threshold Circuits Implemented as Sorting Networks

  • Authors:
  • Stanislaw J. Piestrak

  • Affiliations:
  • Technical Univ. of Wrocław, Wrocław, Poland

  • Venue:
  • IEEE Transactions on Computers
  • Year:
  • 1993

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Abstract

It is shown that an n-input sorting network (SN) can be used to implement an n-variable symmetric threshold functions using the least amount of hardware. An algorithm to derive Boolean functions implemented on any line of any n-input threshold circuit T/sup n/ implemented as a SN is given. A heuristic procedure for generating the minimal test set for any threshold circuit T/sup n/ implemented as a Batcher's SN or any other SN is presented. The number of tests required to detect all stuck-at faults in an n-input SN is determined. A highly regular structure using only one type of simple cell and a suitability for low-level pipelining are other advantages of the circuit T/sup n/. The circuit T/sup n/ can be used as a basic building block of various circuitry supporting the use of all known unidirectional error detecting codes.